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Design of robust electronic circuits for yield optimization

 
: Salzig, C.; Hauser, M.

:

Institute of Electrical and Electronics Engineers -IEEE-:
XIth International Workshop on Symbolic and Numerical Methods, Modeling and Applications to Circuit Design, SM2ACD 2010 : October 4-6, 2010, Gammarth, Tunisia
New York, NY: IEEE, 2010
ISBN: 978-1-4244-6816-4
ISBN: 1-4244-6816-7
ISBN: 978-1-4244-6815-7
5 pp.
International Workshop on Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM2ACD) <11, 2010, Gammarth>
English
Conference Paper
Fraunhofer ITWM ()

Abstract
With the trend from micro- to nanoelectronics the control of production deviations can not keep pace with the reduction of the absolute sizes of semiconductor devices. This results in an increased number of circuits beyond specification. The presented symbolic methods for reducing behavioral models with parameter variations assist designing and optimizing robust electronic circuits to increase the yield of produced circuits.

: http://publica.fraunhofer.de/documents/N-185650.html