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Simulation method for LWIR radiation distribution using a visual ray-tracer

: Utz, A.; Gendrisch, L.; Weiler, D.; Kolnsberg, S.; Vogt, H.

Piprek, J. ; Institute of Electrical and Electronics Engineers -IEEE-:
NUSOD 2011, 11th International Conference on Numerical Simulation of Optoelectronic Devices : 5-8 September 2011, Rome, Italy
Piscataway/NJ: IEEE, 2011
ISBN: 978-1-61284-877-8
ISBN: 978-1-61284-876-1
International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD) <11, 2011, Rome>
Conference Paper
Fraunhofer IMS ()
infrared; Infrarot; ray tracing; Testsystem; test system

Infrared camera with passive, uncooled sensor chips utilize the longwave-infrared (LWIR) range of the electromagnetic spectrum with wavelength between 8 and 14µm for image generation. The reason for this is that every object is self-luminous at room temperature at that wavelenght. Therefore, every surface acts as a source of radiation in an LWIR scenario. To gain an impression and to model the effects and circumstances in an infrared scenario, a simulation method is required. In the visual domain this task is accomplished by ray-tracing software, which allows the generation of synthetic images as well as the analysis of irradiance distribution in a given scene. In this paper we demonstrate a way to apply one of such ray-tracers to a LWIR scenario. We will also demonstrate an application of the proposed simulation method.