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A highly sensitive evaluation method for the determination of different current conduction mechanisms through dielectric layers

 
: Murakami, M.; Rommel, M.; Yanev, V.; Erlbacher, T.; Bauer, A.J.; Frey, L.

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Journal of applied physics 110 (2011), No.5, Art. 054104, 6 pp.
ISSN: 0021-8979
ISSN: 1089-7550
English
Journal Article
Fraunhofer IISB ()
IV characteristics; alpha-V; current conduction mechanisms

: http://publica.fraunhofer.de/documents/N-179533.html