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Determination of propagation of fast induced transient impulses on PCB-level

 
: Taki, M.; John, W.

:

Institute of Electrical and Electronics Engineers -IEEE-; IEEE Electromagnetic Compatibility Society:
IEEE International Symposium on Electromagnetic Compatibility, EMC 2007 : 9 - 13 July 2007, Honolulu, Hawaii
Piscataway, NJ: IEEE Operations Center, 2007
ISBN: 1-424-41349-4
ISBN: 1-424-41350-8
Art. 4305636
IEEE International Symposium on Electromagnetic Compatibility (EMC) <2007, Honolulu/Hawaii>
English
Conference Paper
Fraunhofer IZM ()

Abstract
In this contribution an extended approach to determine the flow of induced transient noise injected into a system of interconnects will be presented. It is now possible to create sub circuits for detailed analysis and use more than one noise source. Dominant and critical signal traces transferring significant noise from multiple noise sources to digital device input ports are determined in the frequency domain using advanced graph searching algorithms. The time domain simulation of the whole signal paths, including device drivers and receivers, is performed using a hybrid analysis in HSPICE environment. The approach is applied to an interconnect system driven by two sensitive inverter gates. The scattering parameters and the waveform of the propagating impulses considering dominant signal paths show good agreement with the total system response.

: http://publica.fraunhofer.de/documents/N-173045.html