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Match-X based microsystem for structural health monitoring

 
: Schubert, L.; Frankenstein, B.; Reppe, G.

:

TU Dresden, Institut für Aufbau- und Verbindungstechnik der Elektronik -IAVT-; Institute of Electrical and Electronics Engineers -IEEE-:
1st Electronics Systemintegration Technology Conference, ESTC 2006. Vol.1 : Dresden, 5.-7.9.2006
New York, NY: IEEE, 2006
ISBN: 1-4244-0552-1
ISBN: 1-4244-0533-X
pp.635-641
Electronics Systemintegration Technology Conference (ESTC) <1, 2006, Dresden>
English
Conference Paper
Fraunhofer IZFP, Institutsteil Dresden ( IKTS-MD) ()

Abstract
Match-X based microsystems are used for continuous Structural Health Monitoring (SHM). They help ensure the reliable and durable functioning of the structure observed. Requirements and how they are met by a SHM system, which is developed as a Match-X based ultrasonic measurement system, are described.

: http://publica.fraunhofer.de/documents/N-172859.html