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Towards a quantitative understanding in electron tomography
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2009
Conference Paper
Titel
Towards a quantitative understanding in electron tomography
Author(s)
Kuebel, C.
Godehardt, M.
Cieslinski, R.
Rozeveld, S.
Hauptwerk
Microscopy and microanalysis 2009. Proceedings
Konferenz
Microscopy Society of America (Annual Meeting) 2009
Microbeam Analysis Society (Annual Meeting) 2009
International Metallographic Society (Annual Meeting) 2009
DOI
10.1017/S1431927609092812
Language
English
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Fraunhofer-Institut für Techno- und Wirtschaftsmathematik ITWM