
Publica
Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten. Mitigating technical risks by creative problem solving approaches
| Institute of Electrical and Electronics Engineers -IEEE-: Annual Reliability and Maintainability Symposium, RAMS 2011. Proceedings : Lake Buena Vista, Florida, USA, 24 - 27 January 2011 Piscataway/NJ: IEEE, 2011 ISBN: 978-1-4244-8857-5 (Print) ISBN: 978-1-4244-8856-8 ISBN: 978-1-4244-5103-6 6 pp. |
| Annual Reliability and Maintainability Symposium (RAMS) <2011, Lake Buena Vista/Fla.> |
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| English |
| Conference Paper |
| Fraunhofer IPT () |
Abstract
The more intensive the competition, the more a company's success depends on its ability to improve and renew its processes. Increasing complexity and interconnectedness of structure and process within production-related areas underline this. Risk oriented management becomes more and more important against the background of increasingly dynamic markets and the rising complexity within the corporate environment [1]. Increasing international interdependence in all business areas and attendant worldwide distribution of most products do not only increase the possible scale of damage, but also the consequences [2]. Especially the risk situation of manufacturers of risk sensitive products has intensified within recent years [3]. Cost intensive field and product recalls accumulate [4]. The direct resulting costs due to not detected risks may be of immense proportions and, in extreme cases, jeopardize the basis of existence for some com panies [5].