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The influence of surface roughness on THz reflection measurements

 
: Herrmann, M.; Wiegand, C.; Jonuscheit, J.; Beigang, R.

:

Institute of Electrical and Electronics Engineers -IEEE-:
IRMMW-THz 2009. Proceedings of the conference. CD-ROM : The 34th International Conference on Infrared, Millimeter, and Terahertz Wave. Paradise Hotel, Busan, Korea, September 21st - 25th 2009
Piscataway, NJ: IEEE, 2009
ISBN: 978-1-4244-5417-4
ISBN: 978-1-4244-5416-7
Art. 5324726
International Conference on Infrared, Millimeter, and Terahertz Wave (IRMMW-THz) <34, 2009, Pusan>
English
Conference Paper
Fraunhofer IPM ()

Abstract
In order to improve the performance of THz time-domain spectroscopy for the detection of hazardous substances in the field of civil security, the influence of surface roughness was studied. We performed transmission and reflection mesurements of smooth and rough metallic and dielectric surfaces varying the degree of surface roughness and the tilt angle of the sample. The results were compared to calculations based on radar theory with good agreement.

: http://publica.fraunhofer.de/documents/N-171654.html