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Relation between dielectric and mechanical losses in ferroelectric poly(vinylidene fluoride - hexafluoropropylene) films

: Frübing, P.; Wang, F.; Günter, C.; Gerhard, R.; Wegener, M.; Jaunich, M.; Stark, W.


IEEE Dielectrics and Electrical Insulation Society:
10th IEEE International Conference on Solid Dielectrics, ICSD 2010 : 4 - 9 July 2010, Potsdam
Piscataway: IEEE, 2010
ISBN: 978-1-424-47945-0
ISBN: 978-1-4244-7944-3
Art. 5567936
IEEE International Conference on Solid Dielectrics, ICSD <10, 2010, Potsdam>
Conference Paper
Fraunhofer IAP ()

The temperature dependences of dielectric permittivity and elastic modulus of poly(vinylidene fluoride - hexafluoropropylene) (P(VDF-HFP)) are compared and explained by use of structural data obtained by differential scanning calorimetry and X-ray analysis. Special emphasis is put on the effect of uniaxial stretching which renders the polymer ferroelectric. It is shown that dielectric and mechanical relaxations at the glass transition (a relaxation) are closely related and not significantly affected by stretching. It is further confirmed that stretching destroys the non-polar spherulitic crystalline structure and produces relatively small-sized polar crystallites. This manifests in the disappearence of the so-called c relaxation which is associated to molecular motions within the spherulitic crystalline lamellae. However, there are discrepancies between dielectric and mechanical losses above the glass transition which point towards a still not described structural trans ition.