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Appearance of rift structures created by acidic texturization and their impact on solar cell efficiency

 
: Nievendick, J.; Demant, M.; Haunschild, J.; Krieg, A.; Souren, F.M.M.; Rein, S.; Zimmer, M.; Rentsch, J.

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Fulltext urn:nbn:de:0011-n-1567700 (676 KByte PDF)
MD5 Fingerprint: 359d34cdbcd5803183109dcc1ca70daf
Created on: 20.12.2014


Institute of Electrical and Electronics Engineers -IEEE-; IEEE Electron Devices Society:
35th IEEE Photovoltaic Specialists Conference, PVSC 2010. Vol.1 : Honolulu, Hawaii, USA, 20 - 25 June 2010
Piscataway/NJ: IEEE, 2010
ISBN: 978-1-4244-5890-5
ISBN: 978-1-4244-5891-2
ISBN: 978-1-4244-5892-9
pp.447-452
Photovoltaic Specialists Conference (PVSC) <35, 2010, Honolulu/Hawaii>
English
Conference Paper, Electronic Publication
Fraunhofer ISE ()
PV Produktionstechnologie und Qualitätssicherung; Silicium-Photovoltaik; Solarthermie; Oberflächen: Konditionierung; Passivierung; Lichteinfang

Abstract
For effectively textured silicon surfaces for solar cell applications two sometimes contradicting preconditions have to be met. On the one hand a roughening of the surface which reduces the amount of incident light reflected on the surface and leads to higher short circuit currents and on the other hand a minimization of the total surface area which results in higher open circuit voltages. Acidic texturing of multi-crystalline silicon (mc-Si) wafers often leads to rough surfaces with strong etch attacks (rift structures) especially at crystal defects. However, in this work we come to the conclusion that, besides the rift structures slightly increase surface area and might also decrease parallel resistance, they do not have a significant influence on solar cell efficiency as well as on open circuit voltage, short circuit current and fill factor. Moreover, the rift structures are an indicator for material quality. Furthermore, in this work is has been found that for these acidic created textures surface roughness correlates with weighted reflection and hence only one of these parameters has to be measured.

: http://publica.fraunhofer.de/documents/N-156770.html