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Mapping the quantitative carrier lifetime and doping concentration with micro resolution

 
: Heinz, F.D.; Gundel, P.; Schubert, M.C.; Warta, W.

:
Fulltext urn:nbn:de:0011-n-1563957 (529 KByte PDF)
MD5 Fingerprint: 55b05151ea55dc9d14da409f0e9c246d
Created on: 9.8.2012


European Commission:
25th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC 2010. Proceedings : 5th World Conference on Photovoltaic Energy Conversion, 6-10 , September 2010, Valencia, Spain
München: WIP-Renewable Energies, 2010
ISBN: 3-936338-26-4
pp.498-503
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <25, 2010, Valencia>
World Conference on Photovoltaic Energy Conversion <5, 2010, Valencia>
English
Conference Paper, Electronic Publication
Fraunhofer ISE ()
Solarzellen - Entwicklung und Charakterisierung; Silicium-Photovoltaik; Charakterisierung von Prozess- und Silicium-Materialien; Messtechnik und Produktionskontrolle; Charakterisierung; Qualitätssicherung und Messtechnikentwicklung: Material; Zellen und Module

Abstract
The measuring technique depicted in this work provides a quantitative carrier lifetime and doping concentration mapping with a spatial resolution of down to 1 µm. While the typical resolution limit of established mapping and imaging methods is limited due to large diffusion lengths above 5 µm, our setup significantly enhances this limit by measuring under high injection levels. This allows for detailed quantitative analyses on the recombination activity of defects such as grain boundaries and dislocations, and on the doping concentration of microscopic technological structures. The presented technique is based on confocal micro photoluminescence spectroscopy. The confocal microscope setup permits for focussed laser illumination and fast low-noise detection of the emitted luminescent radiation. The carrier lifetime and doping concentration is determined by a calibration of the depth dependent luminescent radiation with results from two-dimensional simulations generated by the continuity equations.

: http://publica.fraunhofer.de/documents/N-156395.html