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Luminescence imaging for quantitative solar cell material and process characterization

 
: Glatthaar, M.; Haunschild, J.; Zeidler, R.; Rentsch, J.; Rein, S.; Breitenstein, O.; Hinken, D.; Bothe, K.

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Fulltext urn:nbn:de:0011-n-1563717 (349 KByte PDF)
MD5 Fingerprint: 53528bb221fe380680a4c19f0296fbe3
Created on: 20.12.2014


European Commission:
25th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC 2010. Proceedings : 5th World Conference on Photovoltaic Energy Conversion, 6-10 , September 2010, Valencia, Spain
München: WIP-Renewable Energies, 2010
ISBN: 3-936338-26-4
pp.1825-1827
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <25, 2010, Valencia>
World Conference on Photovoltaic Energy Conversion <5, 2010, Valencia>
English
Conference Paper, Electronic Publication
Fraunhofer ISE ()
PV Produktionstechnologie und Qualitätssicherung; Silicium-Photovoltaik; Charakterisierung von Prozess- und Silicium-Materialien; Messtechnik und Produktionskontrolle; Produktionsanlagen und Prozessentwicklung; Charakterisierung; Qualitätssicherung und Messtechnikentwicklung: Material; Zellen und Module

Abstract
Electro (EL) and photoluminescence (PL) imaging are rather new methods for fast spatially resolved characterization of the electrical properties of crystalline silicon solar cells. EL imaging is experimentally quite simple. Unfortunately in general a quantitative evaluation of the diode quality is not possible, but is limited to very low quality devices. Conversely, PL imaging is experimentally more challenging but allows also a quantitative evaluation of the diode quality for state-of-the-art devices. Experimentally the two techniques are compared analyzing two differently processed solar cells made of multi crystalline sister wavers.

: http://publica.fraunhofer.de/documents/N-156371.html