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Doping concentration and mobility in compensated material: Comparison of different determination methods

 
: Geilker, J.; Kwapil, W.; Reis, I.; Rein, S.

:
Fulltext urn:nbn:de:0011-n-1563633 (261 KByte PDF)
MD5 Fingerprint: 3b191bab9512106a2bc7865591fac766
Created on: 20.12.2014


European Commission:
25th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC 2010. Proceedings : 5th World Conference on Photovoltaic Energy Conversion, 6-10 , September 2010, Valencia, Spain
München: WIP-Renewable Energies, 2010
ISBN: 3-936338-26-4
pp.1322-1327
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <25, 2010, Valencia>
World Conference on Photovoltaic Energy Conversion <5, 2010, Valencia>
English
Conference Paper, Electronic Publication
Fraunhofer ISE ()
PV Produktionstechnologie und Qualitätssicherung; Silicium-Photovoltaik; Charakterisierung von Prozess- und Silicium-Materialien; Messtechnik und Produktionskontrolle; Charakterisierung; Qualitätssicherung und Messtechnikentwicklung: Material; Zellen und Module

Abstract
Determination of dopant concentrations and mobilities is highly relevant for compensated silicon materials but crucial as standard models and standard methods fail due to the presence of multiple dopant species. Thus, an alternative method for direct determination of the net doping concentration p0 is presented, which is based on measurements of the free carrier absorption (FCA) with the help of Fourier Transform Infrared Spectroscopy (FTIR) and enables the majority carrier conductivity mobilities to be determined purely experimentally. Using a set of p-type FZ-silicon samples with a wide range of base resistivities, accuracy of the FTIR-FCA method for determining p0 and of the iron-boron pairing association time method for determining the total boron concentration are evaluated in depth and found to be highly satisfactory. These methods are applied to a set of samples from three compensated silicon crystals, with large differences in the dopant concentrations and the compensation ratio. Measurements of the dopant concentrations and the majority carrier conductivity mobilities as a function of ingot position indicate that the Klaassen mobility model is a good description for the conductivity mobility in compensated p-type silicon for a wide range of dopant concentrations.

: http://publica.fraunhofer.de/documents/N-156363.html