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Stabilization of electrical parameters of thin-film modules under controlled conditions

 
: Aksünger, Ü.; Philipp, D.; Köhl, M.; Weiss, K.-A.

:

Delahoy, A.E. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Thin film solar technology II : 1 - 4 August 2010, San Diego, California, United States; Part of SPIE optics + photonics
Bellingham, WA: SPIE, 2010 (Proceedings of SPIE 7771)
ISBN: 978-0-8194-8267-9
Paper 777108
Conference "Thin Film Solar Technology" <2010, San Diego/Calif.>
Conference "Optics and Photonics" <2010, San Diego/Calif.>
English
Conference Paper
Fraunhofer ISE ()

Abstract
Stabilized performance parameters of PV-modules are necessary for energy yield prediction as well as for the investigation of module degradation effects. The electrical parameters of thin-film modules show stabilization behaviors which are typical for the applied technology. However, this behavior is not satisfyingly understood yet. Different types of thin-film modules have been exposed to artificial irradiation and controlled temperatures in a climatic cabinet with a class B solar simulator for up to 330h. The modules have been connected to electronic loads to perform IV-curve measurements every 15 minutes and MPP-tracking between the measurements. The stabilization of the different parameters (Uoc, Isc, FF, Pmpp) has been analyzed using this data. Temperature correction was done with temperature coefficients which have been measured after a certain irradiation dose had been applied. Flasher-measurements have been used for confirmation of the DC-measurements after the relaxation of the modules after the continuous irradiation exposure was finished.

: http://publica.fraunhofer.de/documents/N-155692.html