Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

Threading dislocations in n- and p-type 4H-SiC material analyzed by etching and synchrotron x-ray topography

 
: Kallinger, B.; Polster, S.; Berwian, P.; Friedrich, J.; Müller, G.; Danilewsky, A.N.; Wehrhahn, A.; Weber, A.-D.

:

Journal of Crystal Growth 314 (2011), No.1, pp.21-29
ISSN: 0022-0248
English
Journal Article
Fraunhofer IISB ()
defects; doping; etching; x-ray topography; silicon carbide

: http://publica.fraunhofer.de/documents/N-151465.html