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2010
Presentation
Titel
Particle detection in the barrier layer production
Titel Supplements
Presentation held at Functional Polymeric Surfaces, Session on 28th of October during the fair "K 2010" in Düsseldorf
Abstract
Even under ideal process conditions particles can cause weak barrier functionality through defects in the layers. - Particles are generated during manufacturing and processing of substrate materials. - Particle-free confectioning of substrate material would be ideal but is not available in the market presently. However, the knowledge for suitable equipment design is available. - For reliable process control and quality assurance an effective detection of particles is necessary. This should also be possible in-line. - A new particle scanner with high sensitivity and very short measurement time has been developed.
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