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Dynamic characterization of MEMS scanners
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2009
Journal Article
Titel
Dynamic characterization of MEMS scanners
Author(s)
Ataman, A.
Seren, H.R.
Schenk, H.
Fraunhofer-Institut für Photonische Mikrosysteme IPMS
Ürey, H.
Zeitschrift
Sensors & Transducers Journal
Language
English
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Fraunhofer-Institut für Photonische Mikrosysteme IPMS