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Multi-view planning for simultaneous coverage and accuracy optimisation

 
: Munkelt, C.; Breitbarth, A.; Notni, G.; Denzler, J.

:

Labrosse, F.; Reyer Zwiggelaar; Yonghuai Liu; Bernie Tiddeman ; British Machine Vision Association -BMVA-:
British Machine Vision Conference, BMVC 2010. Proceedings : Aberystwyth, 31st August - 3rd September 2010, Conference Programme & Abstracts
Edinburgh: BMVA, 2010
ISBN: 1-901725-40-5
pp.118.1-118.11
British Machine Vision Conference (BMVC) <21, 2010, Aberystwyth>
English
Conference Paper
Fraunhofer IOF ()

Abstract
View planning for three-dimensional (3D) reconstruction and inspection solves the problem of finding an efficient sequence of views allowing complete and high quality reconstruction of complex objects. To fulfil this task, view planning methods need to deal with sensor limitations and satisfy predefined goals. Our objective is to jointly evaluate accuracy requirements and coverage during planning, to optimise the reconstruction procedure, as well as to explicitly take configuration space constraints into account.
We present a novel model-based approach, which at the same time optimises accuracy and coverage based on an existing model (e.g. CAD or preview scan). For accuracy optimisation we extended the statistical E-criterion to model directional uncertainty. Coverage is maximised while taking configuration space and sensor characteristics into account. We validate our approach through experimental evaluation using the Next-bestview (NBV) benchmark framework and a robot mounted stereo fringe projection sensor.

: http://publica.fraunhofer.de/documents/N-145778.html