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Separation of recombination properties of silicon solar cells and wafers via luminescence imaging

: Giesecke, J.A.; Kasemann, M.; Warta, W.

Fulltext urn:nbn:de:0011-n-1433028 (598 KByte PDF)
MD5 Fingerprint: 8378e81edb79fd2962b83397087caaba
Created on: 31.8.2012

Sinke, W. ; WIP - Renewable Energies, München; European Commission; UNESCO; World Council for Renewable Energy; International Photovoltaic Equipment Association:
24th European Photovoltaic Solar Energy Conference 2009. CD-ROM : The compiled State-of-the-Art of PV Solar Technology and Deployment. Proceedings of the International Conference held in Hamburg, 21-25 September 2009
München, 2009
ISBN: 3-936338-25-6
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <24, 2009, Hamburg>
Conference Paper, Electronic Publication
Fraunhofer ISE ()

This work is dedicated to separating volume recombination from surface recombination in crystalline silicon solar cells and wafers by exploiting reabsorption of luminescence. Due to reabsorption, the local steady state excess charge carrier depth distribution – which contains information about local recombination properties – affects the luminescence spectrum emitted by a device. This depth distribution can be determined by comparing images acquired with several optical short pass filters to a model based on the continuity equation. An algorithm which yields good results for both electroluminescence on silicon solar cells as well as photoluminescence on silicon wafers is introduced and discussed.