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Spatially resolved contact-resistance measurements on crystalline silicon solar cells

: Kontermann, S.; Hörteis, M.; Ruf, A.; Feo, S.; Preu, R.


Physica status solidi. A 206 (2009), No.12, pp.2866-2871
ISSN: 0031-8965
ISSN: 1862-6300
ISSN: 1521-396X
ISSN: 1862-6319
Journal Article
Fraunhofer ISE ()

This paper demonstrates a method for quantitatively determining the spatially resolved contact resistance of silicon solar cells. Contact-resistance maps obtained by this technique on screen-printed industrial silicon solar cells are presented and discussed. Extending the contact-resistance map to a series-resistance map by adding contributions from the rear, bulk, emitter, and metallization shows this map to qualitatively agree well with photoluminescence (PL) series-resistance imaging. Compared to existing approaches, our technique enables the spatially resolved measurement of the contact resistance separately from any other series-resistance contributions.