English
Deutsch
Log In
Password Login
or
Log in with Fraunhofer Smartcard
Research Outputs
Projects
Researchers
Institutes
Statistics
Fraunhofer-Gesellschaft
Home
Fraunhofer-Gesellschaft
Konferenzschrift
Simulation and reliability on the way from micro to nano
Details
Full
Export
Statistics
Options
2003
Conference Paper
Titel
Simulation and reliability on the way from micro to nano
Author(s)
Michel, B.
Wunderle, B.
Hauptwerk
21. CAD-FEM User's Meeting 2003
Konferenz
CAD-FEM Users' Meeting 2003
Language
English
google-scholar
View Details
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM