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Material mechanics and reliability issues of lead-free solder interconnects

 
: Schubert, A.; Walter, H.; Jung, E.; Gollhardt, A.

Zhang, Q.Q. ; European Commission; IEEE Components, Packaging, and Manufacturing Technology Society:
2nd International Conference on Benefiting from Thermal and Mechanical Simulation in (Micro)-Electronics 2001. Proceedings : 9 - 11 April 2001, Maison de la Chimie, Paris, France
Paris: EuropIA Productions, 2001
ISBN: 0-7803-9806-8
pp.171-178
International Conference on Benefiting from Thermal and Mechanical Simulation in (Micro)-Electronics (EuroSimE) <2, 2001, Paris>
English
Conference Paper
Fraunhofer IZM ()

: http://publica.fraunhofer.de/documents/N-139151.html