Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

On scene-adapted illumination techniques for industrial inspection

 
: Gruna, R.; Beyerer, J.

:
Postprint urn:nbn:de:0011-n-1341321 (2.7 MByte PDF)
MD5 Fingerprint: 800df064a1fd82a7de5570db720752e7
© 2010 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Created on: 12.11.2010


Institute of Electrical and Electronics Engineers -IEEE-:
IEEE Instrumentation and Measurement Technology Conference, I2MTC 2010 : 3-5 may 2010, Austin
New York, NY: IEEE, 2010
ISBN: 978-1-4244-2832-8
ISBN: 978-1-4244-2833-5
pp.498-503
Instrumentation and Measurement Technology Conference (I2MTC) <2010, Austin/Tex.>
English
Conference Paper, Electronic Publication
Fraunhofer IOSB ()

Abstract
In many machine vision applications for automated inspection the illumination design is crucial to the robustness and speed of the inspection process. Hence, there is need to investigate and to experimentally evaluate new illumination designs and techniques. We briefly review a representative selection of illumination techniques that aim to minimize the effort of defect detection by adapting the illuminating light field to the nominal state of the inspection task. Based on this principle we propose an illumination technique using a projector-camera system which provides inspection images that directly display differences in the reflectance between two scenes. A comparison with image differencing for deviation detection shows that the proposed illumination technique is in many cases advantageous from a signal-to-noise point of view.

: http://publica.fraunhofer.de/documents/N-134132.html