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On scene-adapted illumination techniques for industrial inspection

: Gruna, R.; Beyerer, J.

Postprint urn:nbn:de:0011-n-1341321 (2.7 MByte PDF)
MD5 Fingerprint: 800df064a1fd82a7de5570db720752e7
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Created on: 12.11.2010

Institute of Electrical and Electronics Engineers -IEEE-:
IEEE Instrumentation and Measurement Technology Conference, I2MTC 2010 : 3-5 may 2010, Austin
New York, NY: IEEE, 2010
ISBN: 978-1-4244-2832-8
ISBN: 978-1-4244-2833-5
Instrumentation and Measurement Technology Conference (I2MTC) <2010, Austin/Tex.>
Conference Paper, Electronic Publication
Fraunhofer IOSB ()

In many machine vision applications for automated inspection the illumination design is crucial to the robustness and speed of the inspection process. Hence, there is need to investigate and to experimentally evaluate new illumination designs and techniques. We briefly review a representative selection of illumination techniques that aim to minimize the effort of defect detection by adapting the illuminating light field to the nominal state of the inspection task. Based on this principle we propose an illumination technique using a projector-camera system which provides inspection images that directly display differences in the reflectance between two scenes. A comparison with image differencing for deviation detection shows that the proposed illumination technique is in many cases advantageous from a signal-to-noise point of view.