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Angle-resolved THz time domain reflection spectroscopy of rough surfaces

: Robiné, C.D.; Wiegand, C.; Rühle, K.; Ellrich, F.; Weinland, T.; Beigang, R.

Optical Society of America -OSA-, Washington/D.C.:
Conference on Lasers and Electro-Optics and the Quantum Electronics and Laser Science Conference, CLEO/QELS 2010. CD-ROM : Laser Science to Photonic Applications, May 16-21, 2010, San Jose, California
Washington, DC: OSA, 2010
ISBN: 978-1-55752-889-6
ISBN: 978-1-55752-890-2
Paper JWA114
Conference on Lasers and Electro-Optics Europe (CLEO) <2010, San Jose/Calif.>
Quantum Electronics and Laser Science Conference (QELS) <2010, San Jose/Calif.>
Conference Paper
Fraunhofer IPM ()
terahertz; spectroscopy; rough surface

The use of a fiber-coupled terahertz TDS system offers new possibilities for angle-resolved reflection spectroscopy. We put the focus especially on angle-resolved scattering from roughened surfaces of both dielectric and metallic surfaces.