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MEMS based laser imager with diagonal progressive scanning

 
: Sandner, T.; Grasshoff, T.; Klose, T.; Schenk, H.; Massieu, J.L.

:

Institute of Electrical and Electronics Engineers -IEEE-:
IEEE 22nd International Conference on Micro Electro Mechanical Systems, MEMS 2009 : Proceedings of a meeting held 25-29 January 2009, Sorrento, Italy
Piscataway/NJ: IEEE, 2009
ISBN: 978-1-4244-2977-6
ISBN: 978-1-4244-2978-3
pp.951-954
International Conference on Micro Electro Mechanical Systems (MEMS) <22, 2009, Sorrento>
English
Conference Paper
Fraunhofer IPMS ()

: http://publica.fraunhofer.de/documents/N-133879.html