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Robustness characterization of standard cell libraries

 
: Lange, A.; Muche, L.; Haase, J.; Mau, H.T.

:
Fulltext urn:nbn:de:0011-n-1320985 (374 KByte PDF)
MD5 Fingerprint: 7e2b37b5d7448041a404f0ff2adfe4b9
Created on: 21.5.2010


Elst, G. ; Fraunhofer-Institut für Integrierte Schaltungen -IIS-, Institutsteil Entwurfsautomatisierung -EAS-, Dresden:
Dresdner Arbeitstagung Schaltungs- und Systementwurf, DASS 2010 : 18. - 19. Mai 2010, Dresden
Stuttgart: Fraunhofer Verlag, 2010
ISBN: 978-3-8396-0126-6
pp.13-18
Dresdner Arbeitstagung Schaltungs- und Systementwurf (DASS) <2010, Dresden>
English
Conference Paper, Electronic Publication
Fraunhofer IIS, Institutsteil Entwurfsautomatisierung (EAS) ()

Abstract
As feature sizes of integrated circuits shrink, fluctuations in electrical performance parameters drastically gain influence. They are especially important for standard cells as the basic components of digital designs, because they are instantiated numerously. In this paper, we present a methodology to statistically analyze performance parameter fluctuations and to abstract circuit robustness. As a result, we are able to determine the most critical cells in terms of performance parameter variability. These cells should either be optimized or rarely used in digital designs.

: http://publica.fraunhofer.de/documents/N-132098.html