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A novel approach to minimizing the risks of soft errors in mobile and ubiquitous systems

: Sadi, M.S.; Myers, D.G.; Ortega, C.; Jürjens, J.


Institute of Electrical and Electronics Engineers -IEEE-:
TENCON 2009. IEEE Region 10 Conference : 23 - 26 November 2009, Singapore
New York, NY: IEEE, 2009
ISBN: 978-1-4244-4547-9
ISBN: 978-1-4244-4546-2
6 pp.
Conference "TENCON" <2009, Singapore>
Conference Paper
Fraunhofer ISST ()
soft errors; mobile and ubiquitous system