Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

A novel approach to minimizing the risks of soft errors in mobile and ubiquitous systems

 
: Sadi, M.S.; Myers, D.G.; Ortega, C.; Jürjens, J.

:

Institute of Electrical and Electronics Engineers -IEEE-:
TENCON 2009. IEEE Region 10 Conference : 23 - 26 November 2009, Singapore
New York, NY: IEEE, 2009
ISBN: 978-1-4244-4547-9
ISBN: 978-1-4244-4546-2
6 pp.
Conference "TENCON" <2009, Singapore>
English
Conference Paper
Fraunhofer ISST ()
soft errors; mobile and ubiquitous system

: http://publica.fraunhofer.de/documents/N-123171.html