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Nanoscale resolution deformation measurements at crack tips of nanostructured materials and interface cracks

 
: Keller, J.; Vogel, D.; Gollhardt, A.; Michel, B.

Laudon, M. ; Nano Science and Technology Institute -NSTI-:
Nanotechnology 2008. NSTI Nanotechnology Conference and Trade Show. Technical proceedings. Vol.1: Materials, fabrication, particles, and characterization : Boston, June 01 - 05, 2008; An interdisciplinary integrative forum on nanotechnology, biotechnology and microtechnology
Boca Raton, Fla.: CRC Press, 2008
ISBN: 978-1-420-08503-7
ISBN: 978-1-420-08507-5
pp.904-907
Nanotechnology Conference and Trade Show (Nanotech) <11, 2008, Boston/Mass.>
English
Conference Paper
Fraunhofer ENAS ()
Fraunhofer IZM ()

: http://publica.fraunhofer.de/documents/N-120486.html