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Systematical pull and shear test investigations on very small bond loops (wire <= 25 µm) and innovative alloys

 
: Schneider-Ramelow, M.; Göhre, J.

International Microelectronics and Packaging Society -IMAPS-:
41st International Symposium on Microelectronics 2008 : November 2-6, 2008, Rhode Island Convention Center, Providence, Rhode Island, USA
Reston, Va.: IMAPS, 2008
ISBN: 0-930815-86-6
pp.1050-1055
International Symposium on Microelectronics <41, 2008, Providence/RI>
English
Conference Paper
Fraunhofer IZM ()

: http://publica.fraunhofer.de/documents/N-120440.html