Publica
Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten. Reliability Investigation of Large GaAs Pixel Detectors Flip Chip Bonded on Si Readout Chips
:
Klein, M.; Oppermann, H.; Hutter, M.; Fritzsch, T.; Engelmann, G.; Dietrich, L.; Wolf, J.; Brämer, B.; Dudek, R; Reichl, H. | Michel, B.:
MicroNanoReliability 2007, 1st World Congress MicroNanoReliability : Berlin, September, 2 - 5, 2007
Dresden: ddp Goldenbogen, 2007 (Micromaterials and Nanomaterials 6.2007) |
| World Congress MicroNanoReliability <1, 2007, Berlin> |
|
| English |
| Conference Paper |
| Fraunhofer IZM () |