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Pulse and Lock-In Infrared Thermography - Possibilities for Non-Destructive Reliability Analysis of Micro-Electronic Assemblies

 
: May, D.; Schacht, R.; Wunderle, B.; Michel, B.; Reichl, H.

Micromaterials and nanomaterials 6 (2007), pp.150
ISSN: 1619-2486
International Congress on Microreliability and Nanoreliability in Key Technology Applications (MNR) <1, 2007, Berlin>
English
Conference Paper
Fraunhofer IZM ()

: http://publica.fraunhofer.de/documents/N-120392.html