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FIB Based Local Residual Stress Measurement - Potentials and Challenges

 
: Vogel, D.; Michel, B.

Micromaterials and nanomaterials 7 (2007), pp.2
ISSN: 1619-2486
Conference of Advanced Science (NanoScience) <5, 2007, Lichtenwalde>
English
Conference Paper
Fraunhofer IZM ()

: http://publica.fraunhofer.de/documents/N-120343.html