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Experimental characterization of thin Copper foils

 
: Auerswald, E.; Walter, H.; Wittler, O.; Gollhardt, A.; Michel, B.

Micromaterials and nanomaterials 6 (2007), pp.15
ISSN: 1619-2486
International Congress on Microreliability and Nanoreliability in Key Technology Applications (MNR) <1, 2007, Berlin>
English
Conference Paper
Fraunhofer IZM ()

: http://publica.fraunhofer.de/documents/N-120334.html