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Condition Indicators for Reliability Monitoring of Microsystems

 
: Bochow-Ness, O.; Eckert, T.; Fujino, M.; Middendorf, A.; Reichl, H.

Micromaterials and nanomaterials 6 (2007), pp.32
ISSN: 1619-2486
International Congress on Microreliability and Nanoreliability in Key Technology Applications (MNR) <1, 2007, Berlin>
MicroNanoReliability 2007
English
Conference Paper
Fraunhofer IZM ()

: http://publica.fraunhofer.de/documents/N-120288.html