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Flip Chip Reliability of GaAs on Si Thinfilm Substrates Using AuSn Solder Bumps

: Oppermann, H.; Hutter, M.; Klein, M.; Engelmann, G.; Töpper, M.; Wolf, J.

Besser, P.R. ; Materials Research Society -MRS-:
Materials, Technology and Reliability of Advanced Interconnects : Symposium held March 28 - April 1 2005, San Francisco, California, U.S.A.; Symposium B, held at the 2005 MRS spring meeting
Warrendale, Pa.: MRS, 2005 (Materials Research Society Symposium Proceedings 863)
ISBN: 1-558-99816-0
ISSN: 0272-9172
Paper B10.1
Materials Research Society (Spring Meeting) <2005, San Francisco/Calif.>
Symposium B "Materials, Technology and Reliability for Advanced Interconnects" <2005, San Francisco/Calif.>
Conference Paper
Fraunhofer IZM ()

An RF and reliability test vehicles compatible with 77 GHz radar sensors comprise a GaAs chip which was flip chip soldered to a silicon substrate having impedance controlled microstrip transmission lines produced by Cu/BCB/Au thinfilm. Daisy-chain and four-point-Kelvin tests structures were designed for monitoring of the electrical contact resistance of the flip chip solder joints. Temperature cycling tests with and without underfiller were performed and the integrity of solder interconnect was electrically measured after defined cycles. Mechanical shear tests and cross-sectioning revealed the different failure modes found in underfilled and non-underfilled test samples.