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Wirbelstromsonde

Eddy-current probe for e.g. layer thickness measurement at object, has coil body carrying excitation coil and measuring coil, where excitation coil and measuring coil include common electrical ground connection
 
: Jia, Y.; Hillmann, S.; Heuer, H.

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DE 102008027525 A: 20080603
DE 102008027525 A: 20080603
G01N0027
German
Patent, Electronic Publication
Fraunhofer IZFP, Institutsteil Dresden ( IKTS-MD) ()

Abstract
(A1) Die vorliegende Erfindung bezieht sich auf eine Wirbelstronsonde, umfassend eine mit einer Spannungsquelle verbindbare Anregungsspule (1) zur Erzeugung eines Magnetfeldes am Ort eines zu vermessenden Objekts O, eine Messspule 2, von der ein in ihr induziertes Spannungssignal abgreifbar ist, und einen die Anregungsspule 1 und die Messspule 2 tragenden Spulenkoerper K, wobei die Anregungsspule 1 und die Messspule 2 einen gemeinsamen Messanschluss 3 aufweisen.

 

DE 102008027525 A1 UPAB: 20100107 NOVELTY - The probe has an excitation coil (1) for generating a magnetic field at a location of an object (O) to be measured, where the excitation coil is connected to a voltage source. A voltage signal induced in a measuring coil (2) is tapped. A coil body (K) carries the excitation coil and the measuring coil. The excitation coil and the measuring coil include a common electrical ground connection. The coil body is designed as a flat hollow cylinder, where the excitation coil and the measuring coil are arranged inside the cylinder in a common plane (E) perpendicular to a cylinder symmetry axis (Z). DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for a method for testing eddy-current with an eddy-current probe. USE - Eddy-current probe for testing such as crack testing, of a material property of a to-be-measured object, and for layer thickness measurement at the object (all claimed). ADVANTAGE - The coil body carries the excitation coil and the measuring coil, where the excitation coil and the measuring coil include the common electrical ground connection, thus providing an improved eddy-current probe with respect to stray capacitance characteristics, and hence achieving precise measurements of the object in the frequency range of above 25 mega hertz.

: http://publica.fraunhofer.de/documents/N-118913.html