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Optical phase measurements during fs-processing of materials using time-resolved white-light interferometry

 
: Mingareev, I.; Wortmann, D.; Brand, A.; Horn, A.

Institute of Electrical and Electronics Engineers -IEEE-; Optical Society of America -OSA-, Washington/D.C.:
Conference on Lasers and Electro-Optics & Quantum Electronics and Laser Science Conference 2009 : I.e. International Quantum Electronics Conference: CLEO/QELS [i.e. CLEO/IQEC] 2009; Baltimore, MD, USA, 2 - 4 June 2009 [i.e. May 31 - June 5, 2009]; including PhAST 2009
Piscataway/NJ: IEEE, 2009
ISBN: 978-1-4244-5184-5 (online)
ISBN: 978-1-55752-869-8 (print)
2 pp.
Conference on Lasers and Electro-Optics (CLEO) <2009, Baltimore/Md.>
Quantum Electronics and Laser Science Conference (QELS) <2009, Baltimore/ Md.>
International Quantum Electronics Conference (IQEC) <2009, Baltimore/Md.>
Photonic Applications, Systems and Technologies Conference (PhAST) <2009, Baltimore/Md.>
English
Conference Paper
Fraunhofer ILT ()

: http://publica.fraunhofer.de/documents/N-113505.html