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Fault modeling and test pattern generation for static CMOS circuits
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1987
Conference Paper
Titel
Fault modeling and test pattern generation for static CMOS circuits
Author(s)
Hübner, U.
Vierhaus, H.T.
Hauptwerk
Entwurf Integrierter Schaltungen
Konferenz
Workshop Entwurf Integrierter Schaltungen (EIS-Workshop) 1987
Language
English
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