Material analysis for the millimeter wave frequencies

The aim of this project is the development of a measurement system in millimetre wave frequency range for material analysis. Owing to the growing demand for low cost and high performance systems as in the quality control of modern production lines requires a new generation of measurement systems. The characterization of the millimetre wave system and the advantages of the imaging system using mmW-radiation are presented. The configuration of a scanner, which operates in the millimetre wave range, is shown. A vector measurement system can be accomplished up to 110 GHz while the measurement of the amplitude alone can be done up to 260 GHz. Due to conversion losses, the signal output decreases at higher frequencies. Block diagrams of circuits and photographs of hidden objects are shown.