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A submillimeter wave material scanner - applications and prospects

 
: Krebs, C.; Schlauch, E.; Schneider, S.; Nussler, D.

Institute of Electrical and Electronics Engineers -IEEE-:
IRMMW-THz 2007, Joint 32nd International Conference on Infrared and Millimeter Waves, and 15th International Conference on Terahertz Electronics. Vol.2 : City Hall, Cardiff, UK, 3rd - 7rd September, 2007
New York, NY: IEEE, 2007
ISBN: 1-4244-1438-5
ISBN: 978-1-4244-1438-3
pp.989-990
International Conference on Infrared and Millimetre Waves <32, 2007, Cardiff>
International Conference on Terahertz Electronics <15, 2007, Cardiff>
English
Conference Paper
Fraunhofer FHR

Abstract
The aim of this project is the development of a measurement system to analyse different materials. Scalar measurements with a real aperture have been conducted at frequencies between 75 GHz and 260 GHz. Different types of objects have been investigated to show the possibilities and limitations of the system.

: http://publica.fraunhofer.de/documents/N-112623.html