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CMOS fault modeling, test generation and design for testability

 
: Matthäus, C.; Krüger-Sprengel, B.; Glowacz, C.; Hübner, U.; Vierhaus, H.T.

Winter, S.:
Supercomputers. Technology and applications : 14th EUROMICRO symposium on microprocessing and microprogramming (EUROMICRO '88); Zurich, August 29 - September 1, 1988
Amsterdam: North-Holland, 1988 (Microprocessing and Microprogramming 24.1988, Nr.1-5)
ISBN: 0-444-70519-8
pp.233-238
Symposium on Microprocessing and Microprogramming <14, 1988, Zürich>
English
Conference Paper
Fraunhofer GMD
VLSI; Test; CMOS

: http://publica.fraunhofer.de/documents/N-112532.html