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Microstructure of sol-gel derived TiO2 thin films characterized by atmospheric ellipsometric porosimetry

: Bockmeyer, M.; Herbig, B.; Löbmann, P.

DOI: doi:10.1016/j.tsf.2008.09.079

	Thin solid films 517 (2008), No.5, pp.1596-1600 ISSN: 0040-6090

	English
	Journal Article
	Fraunhofer ISC ()

Abstract
Adsorption of water vapor during ellipsometric measurements was performed in-situ for the characterization of solSgel derived TiO2 thin films. The data obtained were compared with complementary results derived from scanning electron microscopy and photocatalytic degradation measurements. Results indicate that a less permeable surface layer encapsulates the porous interior of the films which may become more accessible by defects such as cracks. Atmospheric ellipsometric porosimetry provides a valuable tool for the microstructural characterization of solSgel films.