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Towards a generic process for security pattern integration

 
: Fuchs, A.; Gürgens, S.; Rudolph, C.

:

Institute of Electrical and Electronics Engineers -IEEE-:
20th International Workshop on Database and Expert Systems Application, DEXA 2009 : Aug. 31 2009-Sept. 4 2009, held in Linz, Austria
New York, NY: IEEE, 2009
ISBN: 978-0-7695-3763-4
ISBN: 978-1-4244-4719-0
ISBN: 1-4244-4719-4
pp.171-175
International Workshop on Database and Expert Systems Application (DEXA) <20, 2009, Linz>
English
Conference Paper
Fraunhofer SIT ()

: http://publica.fraunhofer.de/documents/N-111280.html