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2008
Conference Paper
Titel
Material Scanner in the Lower THz
Abstract
The aim of the project is the development of an imaging system for material characterizations. Measurements with real aperture have been conducted at the frequency range between 75 GHz - 220 GHz in amplitude and phase and from 75 GHz - 260 GHz in amplitude. To increase the measurement time a synthetic aperture (SAR) method will be tested. The following paper presents the actually project results.