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Material Scanner in the Lower THz

: Krebs, C.; Schneider, S.; Nüßler, D.


Institute of Electrical and Electronics Engineers -IEEE-; IEEE Microwave Theory and Techniques Society:
33rd International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2008. Online proceedings : 16th International Conference on Terahertz Electronics; 15.-19.9.2008 Pasadena, California, USA
New York, NY: IEEE, 2008
ISBN: 978-1-4244-2119-0
ISBN: 978-1-4244-2120-6
2 pp.
International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz) <33, 2008, Pasadena/Calif.>
International Conference on Terahertz Electronics <16, 2008, Pasadena/Calif.>
Conference Paper
Fraunhofer FHR

The aim of the project is the development of an imaging system for material characterizations. Measurements with real aperture have been conducted at the frequency range between 75 GHz - 220 GHz in amplitude and phase and from 75 GHz - 260 GHz in amplitude. To increase the measurement time a synthetic aperture (SAR) method will be tested. The following paper presents the actually project results.