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Material Scanner in the Submillimeter-Wave Region: Configuration and Signal Processing

: Krebs, C.; Schneider, S.; Hommes, A.; Nüßler, D.

Krapels, K.A.; Salmon, N. A. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Millimetre wave and terahertz sensors and technology : 17-18 September 2008, Cardiff, Wales, United Kingdom
Bellingham, WA: SPIE, 2008 (SPIE Proceedings Series 7117)
ISBN: 0-8194-7349-9
ISBN: 978-0-8194-7349-3
ISSN: 0277-786X
Conference "Millimetre Wave and Terahertz Sensors and Technology" <2008, Cardiff>
Conference Paper
Fraunhofer FHR

The characterization of materials in the millimeter wave frequency range offer many new applications for quality control and security applications. This paper shows results for different applications with a real aperture scanning system in the frequency range between 75 GHz - 325 GHz in amplitude and phase.