Publica
Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten. Material Scanner in the Submillimeter-Wave Region: Configuration and Signal Processing
| Krapels, K.A.; Salmon, N. A. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Millimetre wave and terahertz sensors and technology : 17-18 September 2008, Cardiff, Wales, United Kingdom
Bellingham, WA: SPIE, 2008 (SPIE Proceedings Series 7117)
ISBN: 0-8194-7349-9
ISBN: 978-0-8194-7349-3
ISSN: 0277-786X |
| Conference "Millimetre Wave and Terahertz Sensors and Technology" <2008, Cardiff> |
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| English |
| Conference Paper |
| Fraunhofer FHR |
Abstract
The characterization of materials in the millimeter wave frequency range offer many new applications for quality control and security applications. This paper shows results for different applications with a real aperture scanning system in the frequency range between 75 GHz - 325 GHz in amplitude and phase.