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2002
Conference Paper
Titel
Imaging of the ferroelectric domains pattern in the ultrasonic piezo-mode
Abstract
The Atomic Force Acoustic Microscope technique (AFAM) has been applied in order to investigate the elastic properties of different types of materials. With this technique it is possible to resolve the differences in the local tip-sample stiffness between phases and/or grains having different chemical composition or different crystal lattice orientation. In the case of ferroelectric materials, the situation is even more complicated because the presence of the domains influences local elastic properties within each individual grain. Depending on the method of sample preparation, for example etching, one can see domain patterns on the sample surface using scanning force microscopy [1]. In this case the contrast is caused by topography. A variety of Atomic Force Microscope (AFM) techniques have been applied to image or modify the domains in ferroelectric single crystals as well as in thin films [2, 3]. The AFAM technique allows domain structure imaging in single crystals and in ceramics even when domains do not appear in the topography image [4]. In this way an acoustic image provides information about local stiffness and domain orientation. Coupling the AFAM technique with so called piezo-mode [5-7] can additionally provide information about domain polarization and crystal lattice orientation of the grains [6].