PublicaHier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
The application of energy dispersive diffraction for nondestructive analysis of large material depths and for residual stress determination
X-ray diffraction. New developments in technique and applications : Eighth Workshop New Developments in Technique and Application held in Pfinztal in November 2007
Weinheim: Wiley-VCH, 2009 (Particle & particle systems characterization 26.2009, Nr.3)
|Workshop New Developments in Technique and Application <8, 2007, Pfinztal>|
| Conference Paper, Journal Article|
|Fraunhofer IZM ()|
An important advantage of energy dispersive X-ray diffraction is the opportunity to obtain diffraction patterns without the use of a goniometer. Thus, a combination of small power X-ray tubes, appropriate X-ray optics and high energy resolution detectors enables the construction of small and transportable measurement devices. Specimens of different size, shape and geometry can be investigated. Compared with conventional X-ray diffraction, the energy dispersive method has widened the range of applications in two interesting fields. The simultaneous determination of chemical composition and crystalline structure opens possibilities for single crystal and polycrystalline material characterization. A second effect which can be utilized successfully is based on the wide range of wavelengths, which may be integrated to create one diffraction pattern. So in contrast to the angle dispersive diffraction, a rather large range of penetration depth is available and nondestructivemeasurements into the depth of the specimen become possible. In this paper, the application of X-ray high energy dispersive diffraction is demonstrated. Examples from the fields of composites, steel and micro system technologies are presented. Residual stress analyses were preformed and the results were compared with conventional X-ray stress analyses. New ways to evaluate high energy diffraction patterns will become necessary and some are offered here.