Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

VHDL-AMS statistical analysis for marginal probabilities

Usage of SAE J 2748 statistical analysis package for importance sampling
: Haase, J.; Sohrmann, C.


IEEE Circuits and Systems Society:
IEEE International Behavioral Modeling and Simulation Workshop, BMAS 2009. Proceedings : September 17 - 18, 2009, Doubletree Hotel, San Jose, California
Piscataway, NJ: IEEE, 2009
ISBN: 978-1-4244-5359-7
ISBN: 978-1-4244-5358-0
International Behavioral Modeling and Simulation Workshop (BMAS) <2009, San Jose/Calif.>
Conference Paper
Fraunhofer IIS, Institutsteil Entwurfsautomatisierung (EAS) ()
Monte Carlo simulation; Importance Sampling; VHDL; VHDL-AMS; yield analysis

The impact of parameter variations on components' and systems' characteristics, especially in the area of IC design, has been discussed for several years. To investigate the influence of parameter variations on system characteristics, standard Monte Carlo simulation is often used when exact result cannot be obtained using a deterministic algorithm. However, this procedure may require a huge number of simulation runs if marginal probabilities are estimated. This paper shows how importance sampling as a variance reduction techniques can be used for estimating small probabilities in simulation experiments based onthe SAE J 2748 VHDL-AMS Statistical Analysis Package. Furthermore, application examples are presented to show how the use of parameter sensitivities can help creating random variable distributions for importance sampling.