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Model-driven functional test engineering for service centric systems

 
: Vouffo Feudjio, A.-G.

:
Fulltext urn:nbn:de:0011-n-1049116 (1.6 MByte PDF)
MD5 Fingerprint: b7c5929e5f8de7f7c1f88c4ae8100687
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Created on: 24.9.2009


Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering -ICST-, Brussels; Association for Computing Machinery -ACM-, Special Interest Group on Computer Architecture -SIGARCH-; IEEE Computer Society:
TRIDENTCOM 2009, 5th International Conference on Testbeds and Research Infrastructures for the Development of Networks and Communities. Proceedings : Washington DC, USA, 6-8 April 2009
Piscataway, NJ: IEEE, 2009
ISBN: 978-1-4244-2847-2
ISBN: 978-1-4244-2846-5
7 pp.
International Conference on Testbeds and Research Infrastructures for the Development of Networks and Communities (TridentCom) <5, 2009, Washington/DC>
English
Conference Paper, Electronic Publication
Fraunhofer FOKUS ()
testing; model-driven; patterns; service delivery platforms; IMS; SOA; UTML

Abstract
Functional Testing of service centric systems poses new challenges to traditional test design approaches. As a mean for achieving network and service convergence, such systems integrate various different notations and technologies into a common framework. Assuming that test artifacts targeting each of the technologies involved exist, designing functional tests at the service level, by integrating existing test artifacts is still a very complex engineering task. We propose to address those challenges with a model-driven test engineering approach based on test patterns. The approach allows tests to be designed at a higher level of abstraction as abstract test models, using a test specific, but platform independent modeling notation called UTML(Unified Test Modeling Language). We argue that o ur approach can be helpful in speeding up the production of new test cases through reuse of existing test artifacts and test infrastructure, as well as automated generation of executable test scripts from the abstract test models.

: http://publica.fraunhofer.de/documents/N-104911.html