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Micro- and nanoscale deformation measurements at interface crack tips

 
: Keller, J.; Mayer, S.; Gollhardt, A.; Michel, B.

:

Institute of Electrical and Electronics Engineers -IEEE-:
2nd IEEE International Interdisciplinary Conference on Portable Information Devices, Portable2008) and the 2008 7th IEEE Conference on Polymers and Adhesives in Microelectronics and Photonics, PORTABLE-POLYTRONIC 2008. Proceedings : 17-20 August 2008, Garmisch-Partenkirchen
New York, NY: IEEE, 2008
ISBN: 978-1-4244-2141-1
pp.155
International Interdisciplinary Conference on Portable Information Devices (Portable) <2, 2008, Garmisch-Partenkirchen>
International Conference on Polymers and Adhesives in Microelectronics and Photonics (Polytronic) <7, 2008, Garmisch-Partenkirchen>
English
Conference Paper
Fraunhofer IZM ()

: http://publica.fraunhofer.de/documents/N-101779.html